More Information
Summary:PURPOSE: Methods for selective etching and xenon difluoride formation are provided to promote cleaning of a deposition reactor between deposition cycles by connecting a distance downstream plasma unit to a process reactor and accommodating processing gas. CONSTITUTION: A selective etching method comprises the steps of: providing a structural material containing a first material and a second material to a chamber, providing etchant gas to the chamber, contacting the structural material to the etchant gas and selectively converting the first material to volatile species, and selectively etching the first material to the second material which includes the volatile species from the chamber, wherein the first material is selected from the group consisting of silicon, molybdenum, tungsten, titanium, zirconium, hafnium, vanadium, tantalum, niobium, boron, phosphorus, germanium, arsenic and their mixture and the second material is selected from the group consisting of silicon dioxide, silicon nitride, nickel, aluminum, TiNi alloy, photoresist, phospho silicate glass, boron phosphorous silicate glass, polyimide, gold, copper, platinum, chrome, aluminium oxide, silicon carbide and their mixture.
Bibliography:Application Number: KR20100007532