WAFER PROBE TEST AND INSPECTION SYSTEM
An apparatus for electrically testing a semiconductor device is herein disclosed. The apparatus includes carriers for a semiconductor device and a probe card that are adapted for complementary registration with one another. The coupled carriers may be stacked or used in another high-density arrangem...
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Main Authors | , , |
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Format | Patent |
Language | English Korean |
Published |
27.07.2010
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Subjects | |
Online Access | Get full text |
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Summary: | An apparatus for electrically testing a semiconductor device is herein disclosed. The apparatus includes carriers for a semiconductor device and a probe card that are adapted for complementary registration with one another. The coupled carriers may be stacked or used in another high-density arrangement during electrical test or burn-in to improve test cell utilization. |
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Bibliography: | Application Number: KR20097026186 |