PROBE UNIT AND INSPECTION APPARATUS

PURPOSE: A probe unit and an inspection apparatus are provided to apply inspection signal to all the terminals by contacting a contacting member and a terminal with a pressuring apparatus. CONSTITUTION: A probe block(24) implements an blinking inspection by contacting a plurality of probes(25) and a...

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Bibliographic Details
Main Authors ANZAI MASAYUKI, SAITO HIROKI, MIURA KAZUYOSHI, OSANAI YASUAKI
Format Patent
LanguageEnglish
Korean
Published 04.06.2010
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE: A probe unit and an inspection apparatus are provided to apply inspection signal to all the terminals by contacting a contacting member and a terminal with a pressuring apparatus. CONSTITUTION: A probe block(24) implements an blinking inspection by contacting a plurality of probes(25) and a plurality of terminals installed on an inspected panel. A contacting apparatus closes each terminal in a process of blinking inspection by contacting each probe and each terminal. The contacting apparatus comprises a contacting member(33) and a pressuring apparatus(34).
Bibliography:Application Number: KR20090087985