REFERENCE GRATING FOR ACQUIRE METHOD AND APPARATUS FOR MEASURING THREE-DIMENSIONAL USING MOIRE

PURPOSE: A reference grating acquiring method and apparatus of a 3D measuring system using moire are provided to obtain an accurate moire pattern by correcting a reference grating when a noise is detected. CONSTITUTION: A reference grating acquiring method of a 3D measuring system using moire compri...

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Bibliographic Details
Main Authors KO, KUK WON, MOON, YU HYUN
Format Patent
LanguageEnglish
Published 11.11.2009
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:PURPOSE: A reference grating acquiring method and apparatus of a 3D measuring system using moire are provided to obtain an accurate moire pattern by correcting a reference grating when a noise is detected. CONSTITUTION: A reference grating acquiring method of a 3D measuring system using moire comprises steps of: obtaining the initial reference grating using a light source and a projection grating(S10), detecting whether the initial reference grating includes a noise(S20), correcting the initial reference noise if including a noise(S30), and moving the projection grating and obtaining the next reference grating if not(S50).
Bibliography:Application Number: KR20080042578