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Summary:A nanowire formation method is provided to control easily size and forming location of nanowire and not to move Nanowire to another substrate in order to manufacture semiconductor device. A nanowire formation method comprises steps of: forming SiyGe1-y layer patterned on base layer; performing oxidation process for the patterned SiyGe1-y layer; and forming the oxide layer and nanowire. The step of forming the patterned SiyGe1-y layer includes steps of: preparing lamination structure comprising an insulating layer(10), an Si layer(20) and an SixGe1-x layer(SG1); diversifying the Si layer to the SiyGe1-y layer by performing the oxidation process for the SixGe1-x layer; and patterning the SiyGe1-y layer.
Bibliography:Application Number: KR20070096962