SEMICONDUCTOR DEVICE HANDLING METHOD
A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a...
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Format | Patent |
Language | English |
Published |
18.12.2008
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Abstract | A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a step for performing the function test toward the partial domain of the semiconductor device loaded from the user tray in which a plurality of semiconductor devices(135) is accepted; a step for measuring the time to be required to the function test of the semiconductor device; and a step for performing the test about the whole-area by grouping semiconductor device belonging the base time and the semiconductor device exceeding the base time comparing a measured test time with a set base time. |
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AbstractList | A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a step for performing the function test toward the partial domain of the semiconductor device loaded from the user tray in which a plurality of semiconductor devices(135) is accepted; a step for measuring the time to be required to the function test of the semiconductor device; and a step for performing the test about the whole-area by grouping semiconductor device belonging the base time and the semiconductor device exceeding the base time comparing a measured test time with a set base time. |
Author | CHANG, KYUNG HUN JANG, CHUL KI KANG, MAN GIL OH, SE KYUNG |
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SubjectTerms | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
Title | SEMICONDUCTOR DEVICE HANDLING METHOD |
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