SEMICONDUCTOR DEVICE HANDLING METHOD

A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a...

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Main Authors JANG, CHUL KI, CHANG, KYUNG HUN, OH, SE KYUNG, KANG, MAN GIL
Format Patent
LanguageEnglish
Published 18.12.2008
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Abstract A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a step for performing the function test toward the partial domain of the semiconductor device loaded from the user tray in which a plurality of semiconductor devices(135) is accepted; a step for measuring the time to be required to the function test of the semiconductor device; and a step for performing the test about the whole-area by grouping semiconductor device belonging the base time and the semiconductor device exceeding the base time comparing a measured test time with a set base time.
AbstractList A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a step for performing the function test toward the partial domain of the semiconductor device loaded from the user tray in which a plurality of semiconductor devices(135) is accepted; a step for measuring the time to be required to the function test of the semiconductor device; and a step for performing the test about the whole-area by grouping semiconductor device belonging the base time and the semiconductor device exceeding the base time comparing a measured test time with a set base time.
Author CHANG, KYUNG HUN
JANG, CHUL KI
KANG, MAN GIL
OH, SE KYUNG
Author_xml – fullname: JANG, CHUL KI
– fullname: CHANG, KYUNG HUN
– fullname: OH, SE KYUNG
– fullname: KANG, MAN GIL
BookMark eNrjYmDJy89L5WRQCXb19XT293MJdQ7xD1JwcQ3zdHZV8HD0c_Hx9HNX8HUN8fB34WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8d5BRgYGFgaGhgbGhiaOxsSpAgDxayWC
ContentType Patent
DBID EVB
DatabaseName esp@cenet
DatabaseTitleList
Database_xml – sequence: 1
  dbid: EVB
  name: esp@cenet
  url: http://worldwide.espacenet.com/singleLineSearch?locale=en_EP
  sourceTypes: Open Access Repository
DeliveryMethod fulltext_linktorsrc
Discipline Medicine
Chemistry
Sciences
Physics
ExternalDocumentID KR20080110314A
GroupedDBID EVB
ID FETCH-epo_espacenet_KR20080110314A3
IEDL.DBID EVB
IngestDate Fri Jul 19 16:43:35 EDT 2024
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-epo_espacenet_KR20080110314A3
Notes Application Number: KR20070058914
OpenAccessLink https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081218&DB=EPODOC&CC=KR&NR=20080110314A
ParticipantIDs epo_espacenet_KR20080110314A
PublicationCentury 2000
PublicationDate 20081218
PublicationDateYYYYMMDD 2008-12-18
PublicationDate_xml – month: 12
  year: 2008
  text: 20081218
  day: 18
PublicationDecade 2000
PublicationYear 2008
RelatedCompanies IT&T
RelatedCompanies_xml – name: IT&T
Score 2.7200882
Snippet A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size...
SourceID epo
SourceType Open Access Repository
SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
Title SEMICONDUCTOR DEVICE HANDLING METHOD
URI https://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20081218&DB=EPODOC&locale=&CC=KR&NR=20080110314A
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfr4pSvxAs0Syt8WVfTgfiIF2OMRtZA7CG2Fdl5iYQdyM_763BpQnXvpwl1zbS369u_buCtBOheC2IzLNtAkOPCOak5KFpltZ1f_b0rms4_YD25uYrzNrVoPPTS2M7BP6I5sjIqI44r2U5_Xq_xKLydzK4iH5QNLyeRB3mbqJjtFcIZxZv-uOQxZSldLuKFKDSPIqU2cQs7cH--hIP8qwbdqv6lJW20ZlcAoHY5SXl2dQE3kDjunm77UGHPnrJ-8GHMocTV4gcY3D4hza75X6woBNaBxGCnOnQ-oqXi9gb8PgRfHd2AvZBdwP3Jh6Gk48_9vnfBRtr9JoQj1f5uISFLJIE_QrnKcs4aZuJI7eEegI2ZaJobDB7Sto7ZJ0vZt9AycyCYJ0NOK0oF5-fYtbtLRlcicV9Avqd3xM
link.rule.ids 230,309,783,888,25577,76883
linkProvider European Patent Office
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwfV3dT8IwEL8gfuCbosQP1CUS3hZX9pH5QAy0m0PYRuYgvBFWusTEDCIz_vveGqY88dKHa3K9XvLr3bV3V4DWUghu2SJVDYvgwFOi2kuyUDUzLfp_mxqXddx-YHkT421mzirwWdbCyD6hP7I5IiKKI95zeV6v_y-xmMyt3DwlH0havbhxl7XL6BjNFcKZ9bvOOGQhbVPaHUbtIJJzhanTidE7gEN0sm0ZLE37RV3KeteouGdwNEZ-WX4OFZHVoUbLv9fqcOJvn7zrcCxzNPkGiVscbi6g9V6oLwzYhMZhpDBnOqCO4vUCNhoEr4rvxF7ILuHRdWLqqbjw_G-f82G0K6XegGq2ysQVKGSxTNCvsJ_ThBuanthaR6AjZJkGhsI6t66huY_Tzf7pB6h5sT-ao4DDWziVCRGkoxK7CdX861vcodXNk3uprF_mNX88
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Apatent&rft.title=SEMICONDUCTOR+DEVICE+HANDLING+METHOD&rft.inventor=JANG%2C+CHUL+KI&rft.inventor=CHANG%2C+KYUNG+HUN&rft.inventor=OH%2C+SE+KYUNG&rft.inventor=KANG%2C+MAN+GIL&rft.date=2008-12-18&rft.externalDBID=A&rft.externalDocID=KR20080110314A