SEMICONDUCTOR DEVICE HANDLING METHOD

A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a...

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Bibliographic Details
Main Authors JANG, CHUL KI, CHANG, KYUNG HUN, OH, SE KYUNG, KANG, MAN GIL
Format Patent
LanguageEnglish
Published 18.12.2008
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:A semiconductor device handling method of a test system for semiconductor device is provided to add a disconnection test function in order to reduce the size and the whole manufacturing cost of a test head. A semiconductor device handling method of a test system for semiconductor device comprises: a step for performing the function test toward the partial domain of the semiconductor device loaded from the user tray in which a plurality of semiconductor devices(135) is accepted; a step for measuring the time to be required to the function test of the semiconductor device; and a step for performing the test about the whole-area by grouping semiconductor device belonging the base time and the semiconductor device exceeding the base time comparing a measured test time with a set base time.
Bibliography:Application Number: KR20070058914