SEMI-CONDUCTOR AUTOMATIC TEST EQUIPMENT AND METHOD

An apparatus and a method for automatically inspecting a semiconductor device are provided to reduce an inspection work time for a plurality of semiconductor devices by improving communication efficiency between a computer and instrument boards. An apparatus for automatically inspecting a semiconduc...

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Bibliographic Details
Main Author GIL, YUN JAE
Format Patent
LanguageEnglish
Published 15.07.2008
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An apparatus and a method for automatically inspecting a semiconductor device are provided to reduce an inspection work time for a plurality of semiconductor devices by improving communication efficiency between a computer and instrument boards. An apparatus for automatically inspecting a semiconductor device includes a main frame(200), a test frame(300), and a load frame(400). The apparatus inspects the standard of the semiconductor device mounted on the load frame through a plurality of instrument boards(310) received at the test frame by receiving power from a power supplying device(210) received at the main frame. A plurality of computer sets(220) are installed in the main frame to correspond to the plurality of instrument boards received at the test frame for performing communications, respectively. The main frame has first and second computers(221,222) to transmit a test pattern for testing the standard of the semiconductor device to one instrument board corresponding the computer set and for analyzing the test result of from the tested instrument board.
Bibliography:Application Number: KR20070003042