TEST SOCKET

A test socket is provided to easily the replacement time of the test socket by installing a device for externally displaying the use number of the test socket. A socket body(2) includes a contact terminal(8) which connects leads of a semiconductor chip package with a test device. An upper body(1) pr...

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Bibliographic Details
Main Author LIM, SANG YEOUL
Format Patent
LanguageEnglish
Published 26.07.2007
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
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Summary:A test socket is provided to easily the replacement time of the test socket by installing a device for externally displaying the use number of the test socket. A socket body(2) includes a contact terminal(8) which connects leads of a semiconductor chip package with a test device. An upper body(1) provides pressure to connect the leads of the semiconductor chip package to the contact terminal(8) of the socket body(2). If the upper body(1) is contacted with the socket body(2), a counter(5) is formed so that a number is increased by a contact detecting unit(4). The counter(5) includes a number display unit(6) formed at one side of a test socket.
Bibliography:Application Number: KR20060006884