TEST EMULATOR, EMULATION PROGRAM, AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD

• Main Authors: KATAOKA TAKAHIRO, TADA HIDEKI, HORI MITSUO
• Format: Patent
• Language: English
• Published: 15.06.2007
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

There is provided a test emulator for emulating a test of a semiconductor device. The test emulator includes: test pattern supply means for supplying a test pattern to a device simulator for simulating operation of a semiconductor device; expectation value storage means for storing a comparison timing for comparing an output signal outputted from the device simulator in accordance with the test pattern to a predetermined expectation value while correlating the comparison timing with the expectation value at the comparison timing; margin judgment means used when the output signal at the comparison timing has matched with the expectation value, for judging the size of the margin where the output signal is matched with the output signal; and report means for reporting to a user that the margin at the comparison timing is small when the margin size is smaller than a reference value.