A SEMICONDUCTOR TEST DEVICE AND THE REVERSE METHOD OF THE SEMICONDUCTOR USING THEREOF

A semiconductor device test apparatus and a semiconductor device inversing method using the same are provided to inverse easily a plurality of semiconductor devices by using a tray reversing unit. A semiconductor device test apparatus includes a transfer tray, a test tray, and a tray inversing unit....

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Bibliographic Details
Main Authors JUN, SEUNG KOOK, KIM, JONG HUN, KIM, MOON SEOK
Format Patent
LanguageEnglish
Published 28.11.2006
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
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Summary:A semiconductor device test apparatus and a semiconductor device inversing method using the same are provided to inverse easily a plurality of semiconductor devices by using a tray reversing unit. A semiconductor device test apparatus includes a transfer tray, a test tray, and a tray inversing unit. The transfer tray(30) is used for loading and transferring a semiconductor device. The test tray(40) is used for storing the semiconductor device in device storing portions. The tray reversing unit is used for stacking the test tray on the transfer tray, inversing simultaneously the test tray and the transfer tray, and removing the transfer tray from the test tray. The semiconductor device test apparatus further includes an adsorbing picker.
Bibliography:Application Number: KR20050043062