SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, IN WHICH TEST DATA IS APPLIED TO FUNCTION BLOCK VIA SELECTORS

PURPOSE: A semiconductor integrated circuit device is provided to perform a test of a function block itself like a RAM without increasing a size of a test circuit. CONSTITUTION: The semiconductor integrated circuit device comprises the first and the second logic unit(80,81), and a function block(90)...

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Bibliographic Details
Main Author MAENO HIDESHI
Format Patent
LanguageEnglish
Korean
Published 26.06.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
STATIC STORES
TESTING
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Summary:PURPOSE: A semiconductor integrated circuit device is provided to perform a test of a function block itself like a RAM without increasing a size of a test circuit. CONSTITUTION: The semiconductor integrated circuit device comprises the first and the second logic unit(80,81), and a function block(90) connected between the first logic unit and the second logic unit. A plurality of first selectors(10,11,12) have a parallel path between the output of the first logic unit and the input of the function block and a serial shift path to transfer data serially, and are connected to the output of the first logic unit and the input of the function block by converting the serial shift path. And a plurality of flip flops(30,31,32) store data. A plurality of second selectors(60,61,62) are connected to the serial shift path of a scan path and are connected to the output of the function block and the input of the second logic unit by converting the serial shift path. Test data from the serial shift path of the scan path is applied to the function block via the second selector, and data being output from the function block are output via the second selector.
Bibliography:Application Number: KR20030091890