TRAY OF TEST HANDLER

PURPOSE: A tray for test handler is provided to minimize the loss and prevent the damage of sockets by picking a semiconductor device located on a correct position. CONSTITUTION: A tray for test handler includes a body(110) and an anti-pickup unit. The body(110) includes a plurality of pockets(112)...

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Bibliographic Details
Main Authors KIM, HO GYEONG, KIM, SANG IL, PARK, JEONG HYEON, KIM, DU SEOP
Format Patent
LanguageEnglish
Korean
Published 24.03.2004
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE: A tray for test handler is provided to minimize the loss and prevent the damage of sockets by picking a semiconductor device located on a correct position. CONSTITUTION: A tray for test handler includes a body(110) and an anti-pickup unit. The body(110) includes a plurality of pockets(112) for storing a semiconductor device. The anti-pickup unit prevents an operation for picking up the semiconductor device located on an incorrect position in a process for picking up the semiconductor device stored within the pockets(112). The anti-pickup unit includes a plate(120). The plate(120) includes openings(122) to pass the semiconductor device located on a correct position. 본 발명은 테스트 핸들러의 트레이에 관한 것이다. 본 발명의 트레이는 반도체 디바이스를 수용하는 복수의 포켓을 갖는 몸체와, 포켓에 수용되어 있는 디바이스를 픽업하는 과정에서 위치가 틀어진 디바이스의 픽업을 차단단하는 수단을 갖는다.
Bibliography:Application Number: KR20020057037