SCHOTTKY BARRIER DIODE AND METHOD OF FABRICATING THE SAME

PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be improved due to the distance between electrodes in a Schottky barrier diode, and etching a Schottky junction section cannot be controlled easily in...

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Main Authors ASANO TETSURO, ONODA KATSUAKI, ISHIHARA HIDETOSHI, NAKAJIMA YOSHIBUMI, TOMINAGA HISAAKI, HIRATA KOICHI, SAKAKIBARA MIKITO, MURAI SHIGEYUKI
Format Patent
LanguageEnglish
Korean
Published 06.03.2003
Edition7
Subjects
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Summary:PURPOSE: To solve the problem that a chip cannot be miniaturized smoothly due to mesa etching and a thick polyimide layer and characteristics cannot be improved due to the distance between electrodes in a Schottky barrier diode, and etching a Schottky junction section cannot be controlled easily in a manufacturing method of a Schottky barrier diode. CONSTITUTION: N+-type ion implantation regions are provided on a substrate surface, thus eliminating the need for mesa and a polyimide layer, and achieving the planar type Schottky barrier diode of a compound semiconductor. The distance between electrodes can be reduced, thus shrinking the chip, and improving high-frequency characteristics. Additionally, GaAs is not etched when a Schottky junction region is formed, thus manufacturing a Schottky barrier diode having excellent reproducibility. 종래, 메사 에칭이나 두꺼운 폴리이미드층 등이 있기 때문에, 칩의 소형화가 실현되지 않고, 전극간의 거리가 있어 특성을 향상시킬 수 없었다. 또한, 제조 방법으로는 쇼트키 접합 부분의 에칭 컨트롤이 곤란하였다. 기판 표면에 n형 이온 주입 영역을 형성함에 의해, 메사 및 폴리이미드층을 형성할 필요가 없어져, 화합물 반도체의 플래너형 쇼트키 배리어 다이오드를 실현할 수 있다. 전극간 거리를 좁힐 수 있으므로 칩의 축소가 실현되고, 고주파 특성도 향상된다. 또한, 쇼트키 접합 영역 형성시에는 GaAs를 에칭하지 않으므로, 재현성이 좋은 쇼트키 배리어 다이오드를 제조할 수 있다.
Bibliography:Application Number: KR20020051405