Structure Deformation Measurement Device And Structure Deformation Measurement Method

• Main Authors: LEE, SEON GYU, JUNG, YEONG JU, LEE, BYEONG HA, LEE, YEONG GYUN
• Format: Patent
• Language: English; Korean
• Published: 21.06.2002
• Edition: 7
• Subjects: MEASURING; PHYSICS; TESTING; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR

PURPOSE: An apparatus and method is provided to obtain an accurate result of measurement by using, as a sensor, the optical fiber which is less influenced by the electron and magnetic signal. CONSTITUTION: An apparatus(100) comprises a light source(10); a first optical fiber(20a) an end of which is...