Abstract PURPOSE: To provide a chemical amplification positive type resist material having high contrast between the velocity of alkali dissolution before exposure and that after exposure, high sensitivity, high resolution, a good pattern shape after exposure, superior etching resistance and superior adaptability to a process. CONSTITUTION: The resist material contains a high molecular compound having repeating units of formula (1) (where R1-R3 are each H or methyl; Z is a 2-10C linear, branched or cyclic alkylene; R4 is H, a 1-10C linear, branched or cyclic alkyl or an oxygen-containing 1-10C linear, branched or cyclic alkyl; R5 is a 5-20C tertiary alkyl; (p), (q) and (r) are each a positive number and p+q+r=1) and having a weight average molecular weight of 1,000-500,000. 본 발명은 하기 화학식 1로 표시되는 반복 단위를 갖는 중량 평균 분자량 1,000 내지 500,000의 고분자 화합물을 포함하는 레지스트 재료에 관한 것이다. 또한 본 발명의 레지스트 재료는 노광 전후의 알칼리 용해 속도 콘트라스트가 매우 높고, 고감도, 고해상성을 가지며, 노광 후의 패턴 형상이 양호하고, 우수한 에칭 내성 및 공정 적응성을 갖는 화학 증폭 포지티브형 레지스트 재료로서 바람직하다. <화학식 1> 식 중, R, R, R은 수소 원자 또는 메틸기를 나타내고, Z는 탄소수 2 내지 10의 직쇄상, 분지상 또는 환상의 알킬렌기를 나타내며, R는 수소 원자, 탄소수 1 내지 10의 직쇄상, 분지상 또는 환상의 알킬기, 또는 산소 원자를 포함하는 탄소수 1 내지 10의 직쇄상, 분지상 또는 환상의 알킬기를 나타내고, R는 탄소수 5 내지20의 3급 알킬기를 나타내며, p, q, r은 양수이고, p+q+r=1을 만족하는 수이다.
AbstractList PURPOSE: To provide a chemical amplification positive type resist material having high contrast between the velocity of alkali dissolution before exposure and that after exposure, high sensitivity, high resolution, a good pattern shape after exposure, superior etching resistance and superior adaptability to a process. CONSTITUTION: The resist material contains a high molecular compound having repeating units of formula (1) (where R1-R3 are each H or methyl; Z is a 2-10C linear, branched or cyclic alkylene; R4 is H, a 1-10C linear, branched or cyclic alkyl or an oxygen-containing 1-10C linear, branched or cyclic alkyl; R5 is a 5-20C tertiary alkyl; (p), (q) and (r) are each a positive number and p+q+r=1) and having a weight average molecular weight of 1,000-500,000. 본 발명은 하기 화학식 1로 표시되는 반복 단위를 갖는 중량 평균 분자량 1,000 내지 500,000의 고분자 화합물을 포함하는 레지스트 재료에 관한 것이다. 또한 본 발명의 레지스트 재료는 노광 전후의 알칼리 용해 속도 콘트라스트가 매우 높고, 고감도, 고해상성을 가지며, 노광 후의 패턴 형상이 양호하고, 우수한 에칭 내성 및 공정 적응성을 갖는 화학 증폭 포지티브형 레지스트 재료로서 바람직하다. <화학식 1> 식 중, R, R, R은 수소 원자 또는 메틸기를 나타내고, Z는 탄소수 2 내지 10의 직쇄상, 분지상 또는 환상의 알킬렌기를 나타내며, R는 수소 원자, 탄소수 1 내지 10의 직쇄상, 분지상 또는 환상의 알킬기, 또는 산소 원자를 포함하는 탄소수 1 내지 10의 직쇄상, 분지상 또는 환상의 알킬기를 나타내고, R는 탄소수 5 내지20의 3급 알킬기를 나타내며, p, q, r은 양수이고, p+q+r=1을 만족하는 수이다.
Author KUSAKI WATARU
TAKEDA TAKANOBU
NAGURA SHIGEHIRO
WATANABE OSAMU
HIRAHARA KAZUHIRO
MAEDA KAZUNORI
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DocumentTitleAlternate 레지스트 재료 및 패턴 형성 방법
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Snippet PURPOSE: To provide a chemical amplification positive type resist material having high contrast between the velocity of alkali dissolution before exposure and...
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SubjectTerms APPARATUS SPECIALLY ADAPTED THEREFOR
BASIC ELECTRIC ELEMENTS
CHEMISTRY
CINEMATOGRAPHY
COMPOSITIONS BASED THEREON
COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
ELECTROGRAPHY
HOLOGRAPHY
MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVINGCARBON-TO-CARBON UNSATURATED BONDS
MATERIALS THEREFOR
METALLURGY
ORGANIC MACROMOLECULAR COMPOUNDS
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
SEMICONDUCTOR DEVICES
THEIR PREPARATION OR CHEMICAL WORKING-UP
USE OF INORGANIC OR NON-MACROMOLECULAR ORGANIC SUBSTANCES ASCOMPOUNDING INGREDIENTS
Title Resist Composition and Patterning Process
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