LIQUID CRYSTAL DISPLAY DEVICE AND MANUFACTURING METHOD THEREOF

• Main Authors: MIYATA KAZUSHI, OSHIRI RYOICHI, NIWA SUSUMU, OHGIICHI KIMITOSHI, TSURUOKA SHINICHI
• Format: Patent
• Language: English; Korean
• Published: 15.09.2001
• Edition: 7
• Subjects: ADVERTISING; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION; CRYPTOGRAPHY; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING; DISPLAY; EDUCATION; FREQUENCY-CHANGING; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; NON-LINEAR OPTICS; OPTICAL ANALOGUE/DIGITAL CONVERTERS; OPTICAL LOGIC ELEMENTS; OPTICS; PHYSICS; SEALS; TECHNICAL SUBJECTS COVERED BY FORMER USPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF

PURPOSE: An LCD(Liquid Crystal Display) device is provided to easily test the short circuit of scanning line lead lines or signal line lead lines as well as the performance of a TFT(Thin Film Transistor). CONSTITUTION: A manufacturing method of an LCD comprises steps of letting drain driver output terminals be divided into six groups(R1,R2,G1,G2,B1,B2) of positive polarity and negative polarity for the three primary colors, bundling respective ones together for connection to drain line common line, drawing the drain line common lines out of a drain driver mount region, letting gate driver output terminals be divided into three groups(GA,GB,GC) of a front stage and next stage plus rear stage, bundling respective ones together for connection to gate line common lines, drawing the gate line common lines out of a gate driver mount region, and performing tests with probes attached to test terminals provided at such drain line common lines and gate line common lines. The probes are manufactured easily to reduce the entire cost.