SEMICONDUCTOR INTEGRATED CIRCUIT AND RECORDING MEDIUM

• Main Author: NOGUCHI KOKI
• Format: Patent
• Language: English; Korean
• Published: 16.04.2001
• Edition: 7
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE: A semiconductor integrated circuit and a recording medium is provided to shorten the time required for testing a plurality of circuit modules by reducing the volume of test data and test results data being inputted/ outputted externally. CONSTITUTION: A semiconductor integrated circuit and a recording medium wherein the amount of test data inputted from and outputted to the outside to test a plurality of circuit modules and the amount of test result data are reduced and a test time interval is shortened. When each of tested circuits is tested, test control information is externally inputted to a test interface circuit, and test control information is set to each of scan registers(41) of circuit modules to be tested, through a test signal chain. When an instruction for a test operation is given to each of test control circuits(42) through a control terminal(32), a test circuit allows the tested circuits to be tested based on the test control information on a parallel basis. Test results are read into the test interface circuit from the scan registers(41) through the test signal chain, followed by output to the outside. The test operations for the circuit modules are parallelized and the test interface circuit is shared between the respective circuit modules.