AIR CIRCULATION SYSTEM FOR TEST CHAMBER OF ELECTRONIC COMPONENT

Disclosed is an electronic component test chamber air circulation system, which includes: a chamber in which testing of electronic components in a hot or cold environment is carried out; a discharge side valve unit installed in an exhaust hole formed on one side of the chamber, and having a door val...

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Bibliographic Details
Main Authors LEE SANG EUN, PARK BEOM JOON, LEE HYEONG NO, KIM BYUNG NO
Format Patent
LanguageEnglish
Korean
Published 31.08.2021
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:Disclosed is an electronic component test chamber air circulation system, which includes: a chamber in which testing of electronic components in a hot or cold environment is carried out; a discharge side valve unit installed in an exhaust hole formed on one side of the chamber, and having a door valve installed to selectively open and close the inside and outside the chamber and an air valve to allow external air to flow into the exhaust hole; an air exhaust device providing a discharge pressure for forcibly discharging air in the chamber to the discharge side valve unit; and a control unit selectively driving and controlling the door valve, the air valve, and the air exhaust device. 전자부품에 대한 핫 또는 콜드 환경에서의 테스트가 진행되는 챔버와, 챔버의 일측에 형성되는 배기공에 설치되며 챔버 내부와 외부를 선택적으로 개폐하게 설치되는 개폐밸브(Door Valve)와 배기공으로 외부 에어가 유입되도록 하는 에어밸브를 가지는 배출측 밸브유닛과, 배출측 밸브유닛으로 챔버 내의 에어를 강제 배출시키기 위한 배출압력을 제공하는 에어 배기장치 및, 개폐밸브, 에어밸브 및 에어 배기장치를 선택적으로 구동제어하는 제어유닛을 포함하는 것을 특징으로 하는 전자부품 테스트 챔버 에어 순환 시스템이 개시된다.
Bibliography:Application Number: KR20210036862