CONNECTOR FOR SEMICONDUCTOR DEVICE TESTING EQUIPMENT AND TEST BOARD FOR BURN-IN TESTER

PURPOSE: A connector for semiconductor device testing equipment and a test board for a burn-in tester are provided to prevent damage to connection pins by guiding the stable insertion of the connection pins using a ground plate. CONSTITUTION: A connector(120) for semiconductor device testing equipme...

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Bibliographic Details
Main Authors KIM, DAE KYOUNG, KIM, JIN HEE
Format Patent
LanguageEnglish
Korean
Published 12.07.2012
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE: A connector for semiconductor device testing equipment and a test board for a burn-in tester are provided to prevent damage to connection pins by guiding the stable insertion of the connection pins using a ground plate. CONSTITUTION: A connector(120) for semiconductor device testing equipment comprises multiple connection pins(121), one or more ground plates(122), and a receiving frame(123). The ground plates improve the properties of electrical signals transferred through the connection pins. The receiving frame receives and supports the connection pins and the ground plates.
Bibliography:Application Number: KR20120020851