PROBE UNIT BLOCK AND MANUFACTURING METHOD OF THE SAME

A probe unit block and a manufacturing method of the same are provided to improve product yield by removing the necessity of exchange of all probe block according to product model change. A probe(100) comprises a probe frame(200) and probe head(300), and a linear guide(250) is installed between the...

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Bibliographic Details
Main Author OH, HYEONG GEUN
Format Patent
LanguageEnglish
Published 10.08.2009
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:A probe unit block and a manufacturing method of the same are provided to improve product yield by removing the necessity of exchange of all probe block according to product model change. A probe(100) comprises a probe frame(200) and probe head(300), and a linear guide(250) is installed between the probe frame and the probe head. A probe block(400) is arranged at the lower part of the probe head, and a fixing unit(350) is engaged between the probe head and the probe block. A main block comprises a protrusion in which an accommodating groove of a leg shape is formed, and a ceramic bar facilitates the combination of the slit guide plate and the main block.
Bibliography:Application Number: KR20090000339