APPARATUS FOR MEASUREMENT OF SURFACE PROFILE AND CONTROL METHOD THEREOF

An apparatus for measuring a surface profile and a control method thereof are provided to apply a field of view having different resolution depending on the size and disposition of electronic parts and soldering parts. An apparatus for measuring a surface profile includes a photographing part(20), a...

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Bibliographic Details
Main Authors YOO, YOUNG WOONG, CHO, CHEOL HOON
Format Patent
LanguageEnglish
Published 07.03.2008
Subjects
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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Summary:An apparatus for measuring a surface profile and a control method thereof are provided to apply a field of view having different resolution depending on the size and disposition of electronic parts and soldering parts. An apparatus for measuring a surface profile includes a photographing part(20), and a controller(50). The photographing part includes a CCD camera(21), a condensing lens(22), a first actuator(23), and a second actuator(24). The condensing lens is disposed between an object to be measured and the CCD camera. The first actuator moves the CCD camera to adjust the distance between the CCD camera and the object. The second actuator moves the condensing lens to adjust the distance between the condensing lens and the CCD camera. The controller controls the first actuator and the second actuator to adjust the distances to vary resolution of a field of view.
Bibliography:Application Number: KR20070032742