FAILURE DIAGNOSTIC DEVICE FOR INTEGRATED CIRCUIT AND RECORDING MEDIUM FOR THE DEVICE

PURPOSE: To estimate a failure part of a tested device without opening it and to diagnose the failure in a short time by estimating the failure part via only the processing of a computer, etc. CONSTITUTION: A tester 105 tests a DUT 106 according to the test vector stored in a test vector store unit...

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Bibliographic Details
Main Author SAKAGUCHI KAZUHIRO
Format Patent
LanguageEnglish
Korean
Published 16.04.2002
Edition7
Subjects
BASIC ELECTRIC ELEMENTS
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE: To estimate a failure part of a tested device without opening it and to diagnose the failure in a short time by estimating the failure part via only the processing of a computer, etc. CONSTITUTION: A tester 105 tests a DUT 106 according to the test vector stored in a test vector store unit 102 and the test condition stored in a test program store unit 103. The test result of the tester 105 is stored in a test result store unit 108. Meanwhile, a simulation result store unit 107 and the unit 108 are connected to a failure decision unit 109. The unit 109 estimates the failure part of the DUT 106 based on the simulation result of a switch level simulator 104 and the test result of the tester 105. The estimation result of the unit 109 is sent to an output device 110 connected to the unit 109, and the device 110 shows the estimated failure part of the DUT 106.
Bibliography:Application Number: KR19980013877