STATIC-FREE INTERROGATING CONNECTOR FOR ELECTRIC COMPONENTS

An improved connector (8) for connection to and identification and testing of electric components such as integrated circuits is described which features a number of spring biased contact elements (12) normally in contacting relation with a shorting bar (14). When a particular component (20) is plac...

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Bibliographic Details
Main Authors LAUKS, IMANTS R, ZELIN, MICHAEL P
Format Patent
LanguageEnglish
Korean
Published 15.01.1999
Edition6
Subjects
BASIC ELECTRIC ELEMENTS
CURRENT COLLECTORS
ELECTRICITY
LINE CONNECTORS
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:An improved connector (8) for connection to and identification and testing of electric components such as integrated circuits is described which features a number of spring biased contact elements (12) normally in contacting relation with a shorting bar (14). When a particular component (20) is placed in a specified physical relation to the connector (8), a combination of exposed electrical contacts (28) and nonconductive elements (22b) on the component to be tested displace specified ones of the contact members (12) away from the shorting bars (14), providing a connection pattern which can be detected. At the same time, test signals can be applied to the electric component (20) to be tested. The circuit may be identified and its specific parameters identified and characterized in a single operation according to the invention. Advantageously, the shorting bar (14) is grounded so that any static charge on the component (20) to be tested is grounded before the contact elements (12) are displaced from the shorting bar (14).
Bibliography:Application Number: KR19890702402