MICROMETER

• Main Authors: HIROTA HIROTSUGU, NAKADOI TETSUYA
• Format: Patent
• Language: English
• Published: 23.03.1988
• Subjects: CHEMICAL SURFACE TREATMENT; CHEMISTRY; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATIONOR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY IONIMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; COATING MATERIAL WITH METALLIC MATERIAL; COATING METALLIC MATERIAL; DIFFUSION TREATMENT OF METALLIC MATERIAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION INGENERAL; METALLURGY; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THESURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION

PURPOSE:To improve the durability and reliability of a micrometer by providing a super hard layer consisting of the carbide, nitride, carbonitride, etc., of specific metals to at least the tips of the measuring parts of the spindle an anvil of the micrometer. CONSTITUTION:An object to be measured is interpoosed between the spindle 2 and anvil 3 of the micrometer and the tip part 2a thereof is advanced and retreated by the rotation of the spindle 2, by which the length, etc. of the object to be measured are measured. The super hard layer consisting of carbide, nitride and carbonitride (for example, TiC, TiN, SiC, etc.) groups IVa Va, VIa metals of the periodic table and Si, diamond, hard carbon, etc., is formed on tips 2a, 3a of the spindle 2 and anvil 3 3 by a vacuum deposition method, sputtering method, ion plating method, CVD method, PVD method, etc. The durability and reliability which are excellent for a long period of time are thus maintained without the wear of the measuring ends 2a, 3a.