METHOD FOR MEASURING TIME CHARACTERISTIC OF PULSE WAVEFORM

• Main Author: MATSUI SHOZO
• Format: Patent
• Language: English
• Published: 14.09.1988
• Subjects: MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; TESTING

PURPOSE:To accurately measure characteristic measured values such as pulse width and cycles even if its pulse waveform rings by measuring time characteristics of the pulse waveform according to measured values obtained by measuring the level value of the pulse waveform at intervals of unit time. CONSTITUTION:A reference level VS is set by a level setting part 4 and an upper-limit level VH and a lower-limit level VL set above and below this reference level VS are measured by an upper-limit level detection part 5 and a lower- limit level detection part 7. Measurement data on those pulse waveforms are all stored in a memory 2. Then their measured values are read out in time series and a point where a reference level VS before them is measured is regarded as a pulse risetime A. On condition that a measured value rises above the upper limit level VH and then falls below the lower-limit level VL, the point where the reference level VS before it is regarded as a pulse falltime C. An arithmetic part computes a waveform characteristic value from the pulse risetime A and pulse falltime C.