IC TESTING DEVICE

PURPOSE:To easily vary the contents of a connection between a measuring circuit and a pin by driving a relay according to data whose bit positions are assigned corresponding to respective relays respectively. CONSTITUTION:A CPU 10 reads pin specification data out of a memory 11 and stores it in a pi...

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Bibliographic Details
Main Author FUKUZAKI TADASHI
Format Patent
LanguageEnglish
Published 16.05.1988
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE:To easily vary the contents of a connection between a measuring circuit and a pin by driving a relay according to data whose bit positions are assigned corresponding to respective relays respectively. CONSTITUTION:A CPU 10 reads pin specification data out of a memory 11 and stores it in a pin register 12. The pin specification data indicates that a flag corresponding to a bit position corresponding to the number of a relay or pin is 1 as to connections between respective connection pins and DC measurement units 2-5 that have the pin numbers. Shift registers 15a-15d are driven successively in series, and consequently AND circuits 18a-18e are placed in a gate state in series; and AND outputs become true at bit positions where bits in the register 12 are set and relay driving circuits 19a-19e are connected at every time.
Bibliography:Application Number: JP19860257598