IC TESTING DEVICE

PURPOSE:To easily vary the contents of a connection between a measuring circuit and a pin by driving a relay according to data whose bit positions are assigned corresponding to respective relays respectively. CONSTITUTION:A CPU 10 reads pin specification data out of a memory 11 and stores it in a pi...

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Bibliographic Details
Main Author FUKUZAKI TADASHI
Format Patent
LanguageEnglish
Published 16.05.1988
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Summary:PURPOSE:To easily vary the contents of a connection between a measuring circuit and a pin by driving a relay according to data whose bit positions are assigned corresponding to respective relays respectively. CONSTITUTION:A CPU 10 reads pin specification data out of a memory 11 and stores it in a pin register 12. The pin specification data indicates that a flag corresponding to a bit position corresponding to the number of a relay or pin is 1 as to connections between respective connection pins and DC measurement units 2-5 that have the pin numbers. Shift registers 15a-15d are driven successively in series, and consequently AND circuits 18a-18e are placed in a gate state in series; and AND outputs become true at bit positions where bits in the register 12 are set and relay driving circuits 19a-19e are connected at every time.
Bibliography:Application Number: JP19860257598