METHOD AND APPARATUS FOR ANALYZING TRANSFER CHARACTERISTIC

PURPOSE:To measure the transfer function of an article to be measured within a short time, by subjecting the input and output signals of an article to be measured to fast Fourier transformation and analyzing the spectrum signals after said Fourier transformation. CONSTITUTION:When a signal send-out...

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Bibliographic Details
Main Author MUTO KAZUO
Format Patent
LanguageEnglish
Published 06.05.1988
Subjects
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To measure the transfer function of an article to be measured within a short time, by subjecting the input and output signals of an article to be measured to fast Fourier transformation and analyzing the spectrum signals after said Fourier transformation. CONSTITUTION:When a signal send-out signal is sent to a signal generator 1 from a waveform writing control circuit 2, an impulse or burst like signal is applied to the input terminal 14 of an article 16 to be measured from the signal generator 1. The input signal to the article 16 to be measured and the output signal from the output terminal 15 of said article 16 are digitized by A/D converters 3, 4 to be stored in wave memories 5, 6 and displayed on a display device 12. When an analytical waveform is indicated on the basis of the displayed waveform by an analytical waveform indication means 13, an waveform to be analyzed is applied to Fourier transformers 9, 10 from the waveform erasing circuit 8 connected to an input side memory 5 and an output side memory 6. An operation circuit 11 calculates a transfer function on the basis of the spectrum signals after Fourier transformation.
Bibliography:Application Number: JP19860247468