PARTICLE ANALYZER

• Main Authors: YUGUCHI NAOKI, TAGO AKIRA
• Format: Patent
• Language: English
• Published: 17.02.1987
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE:To enable axial adjustment between the center axis of the flow of a sample liquid and the optical axis of irradiation light accurately and easily, by detecting and evaluating the intensity distribution of the irradiation light when an adjusting liquid runs to absorb light in the wavelength range of the irradiation light. CONSTITUTION:Particles to be inspected passes through a passage section 2 at the center of a flowcell 1 by being wrapped with a sheath liquid of a fast laminar flow and a laser light source 3 and a photoelectric detector 7 are arranged in the direction perpendicular to the flow a substance absorbing an adjusting liquid S; light in the wavelength range of the laser light L is when passed through the passage section 2 by being wrapped with the sheath liquid, the S absorbs a part of the laser light L. The state of the intensity distribution of the laser light L forms an image on a light array sensor 9 through a beam splitter 5 and the resulting output signal waveform I is displayed on a monitor 10 as light intensity distribution waveform P. This enables the checking for the coincidence between the optical axis 01 of the laser light L and the center of the flow of the adjusting liquid S from the symmetry, right and left, of the waveform P.