SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE

PURPOSE:To enable even the setting of a test mode by commanding the setting of the test mode when a specific voltage is detected by one of voltage detecting circuits and supplying an input signal for testing to terminals except a terminal to which the specific voltage is applied. CONSTITUTION:Input...

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Bibliographic Details
Main Author KUWATA YOSHIKI
Format Patent
LanguageEnglish
Published 30.01.1987
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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Summary:PURPOSE:To enable even the setting of a test mode by commanding the setting of the test mode when a specific voltage is detected by one of voltage detecting circuits and supplying an input signal for testing to terminals except a terminal to which the specific voltage is applied. CONSTITUTION:Input signals A and B are supplied to terminals 11a and 11b and those input signals are further supplied as driving signal to the internal circuit of a semiconductor integrated circuit through inverters 12a and 12b and further 13a and 13b in series. High voltage detecting circuits 14a and 14b, on the other hand, are connected to the terminals 11a and 11b and detect the supply of a high-voltage signal exceeding a source voltage in normal mode operation to the terminals 11a and 11b, thereby supplying high-voltage detection signals to a NOR circuit 15. The circuit 15 outputs a test mode setting command signal through an inverter 16 in response to the high voltage detection signals. Thus, input terminals which are used normally are used for starting the test mode in common.
Bibliography:Application Number: JP19850161120