METHOD FOR MEASURING ARTICLE TO BE MEASURED WITH X-RAYS IN NON-DESTRUCTIVE STATE

• Main Author: KOMURA YUKIO
• Format: Patent
• Language: English
• Published: 07.09.1987
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PURPOSE:To enable on-line measurement, by a method where white X-rays from an X-ray source are passed through two or more kinds of filters and X-ray beam after transmission is allowed to irradiate a measuring objective area and the intensity of transmitted X-rays is measured by an X-ray detector. CONSTITUTION:White X-rays X11, X21 emitted in a pulse like form from an X-ray source 1 are passed through filters 2L, 2H to come to pseudo monochromatic X-rays X12, X2 which is turn pass through a collimator 3 to irradiate the measuring objective area (one cross-section) o an article 10 to be measured. Each X-ray beam transmitted through the article 10 to be measured, that is, each of transmitted X-rays X13, X23 is collimated by a collimator 4 and the quantities of said X-rays are measured through X-ray detectors 5L, 5H. In this case, because X-ray beam irradiates from one direction toward the article 10 to be measured, it is convenient to measure the axially symmetric rotating article 10 to be measured and the article 10 to be measured can be measured by an on-line system and it is unnecessary to move the X-ray source 1 and the X-ray detectors 5L,5H.