ECCENTRICITY MEASURING METHOD

• Main Authors: KOYAMA ETSUROU, AOYAMA ICHIROU, TAKASE KENJI, SHIBUYA KAZUO
• Format: Patent
• Language: English
• Published: 14.05.1985
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PURPOSE:To improve accuracy, by contacting the tip of a material to be measured with a mirror-state contact surface, turning the material, projecting light on the contact part, and measuring the state of eccentricity by the movement of the contact point between the shade of the tip and the reflected image. CONSTITUTION:An L shaped block 12 and supporting blocks 13 and 14 are provided on a substrate 11, which can be freely moved up and down, in a holding mechanism 10. A side surface 18 of the block 12 is machined into a mirror surface. Spherical bodies 22... are rotatably supported on cut-out parts 20 and 21 at the top parts of the blocks 13 and 14. A spherical tip surface 24 of a material to be measured 23 is contacted to the surface 18, which is supported by the spherical bodies 22. The material to be measured 23 can be turned by an endless belt 27, which is driven by a motor (not shown). Light is projected on the surfaces 18 and 24 from a projecting part 4. A shade 36 of the surface 24 and a reflected image 37 are projected on a screen 33. The state of the movement of a contact point 38 of the shade 36 and the image 37 is measured by a scale 39 of the screen 33, and the amount of eccentricity can be obtained.