HOT-CATHODE ELECTRON IMPACT TYPE ION SOURCE

• Main Authors: ITOU TAKAO, WATANABE FUMIO, KOMAKI SHIYOUJIROU, MIYAMOTO MASAO
• Format: Patent
• Language: English
• Published: 14.05.1985
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS; ELECTRICITY; GAMMA RAY OR X-RAY MICROSCOPES; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; IRRADIATION DEVICES; MEASURING; NUCLEAR ENGINEERING; NUCLEAR PHYSICS; PHYSICS; TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR; TESTING

PURPOSE:To obtain a hot-cathode electron impact type ion source of high sensitivity which is used for a tetrode analyzer by installing a hot cathode around an anode and by installing doughnut-like electrodes (which constitute an electron diaphragm electrode) over and under the hot cathode. CONSTITUT...