HOT-CATHODE ELECTRON IMPACT TYPE ION SOURCE

PURPOSE:To obtain a hot-cathode electron impact type ion source of high sensitivity which is used for a tetrode analyzer by installing a hot cathode around an anode and by installing doughnut-like electrodes (which constitute an electron diaphragm electrode) over and under the hot cathode. CONSTITUT...

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Bibliographic Details
Main Authors ITOU TAKAO, WATANABE FUMIO, KOMAKI SHIYOUJIROU, MIYAMOTO MASAO
Format Patent
LanguageEnglish
Published 14.05.1985
Subjects
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
GAMMA RAY OR X-RAY MICROSCOPES
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
IRRADIATION DEVICES
MEASURING
NUCLEAR ENGINEERING
NUCLEAR PHYSICS
PHYSICS
TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR
TESTING
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Summary:PURPOSE:To obtain a hot-cathode electron impact type ion source of high sensitivity which is used for a tetrode analyzer by installing a hot cathode around an anode and by installing doughnut-like electrodes (which constitute an electron diaphragm electrode) over and under the hot cathode. CONSTITUTION:An annular hot cathode 3 is installed around a cylindrical cage- like anode 1 which has an electron permeable grid-like or mesh-like circumferential area. At the same time, doughnut-like electrode plates 21 and 22 (which constitute an electron diaphragm electrode 2) are installed over and under the cathode 3, thereby constituting a hot-cathode electron impact type ion source for a tetrode analyzer. As a result, it is possible to concentrate thermions discharged from the hot cathode 3 efficiently in the cylindrical cage-like anode 1 without deteriorating the electron diaphragm effect, thereby obtaining an ion source of high sensitivity.
Bibliography:Application Number: JP19830192115