AMORPHOUS SILICON PHOTOSENSOR

PURPOSE:To enable to eliminate the possibility of deterioration in characteristics of amorphous Si by a method wherein a cyclized rubber photoresist material is utilized at a part of insulating material. CONSTITUTION:A Cr electrode 2 is formed on a glass substrate 1, a photodiode consisting of an am...

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Main Authors ORITSUKI RIYOUJI, KANAI HIROMI, SAITOU SUSUMU
Format Patent
LanguageEnglish
Published 14.03.1985
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Abstract PURPOSE:To enable to eliminate the possibility of deterioration in characteristics of amorphous Si by a method wherein a cyclized rubber photoresist material is utilized at a part of insulating material. CONSTITUTION:A Cr electrode 2 is formed on a glass substrate 1, a photodiode consisting of an amorphous Si layer 3 is provided thereon, and after an Al electrode 4 has been formed, a passivation is perfomred using a cyclized rubber photoresist film 5. Besides, a microscopic working can be freely performed on the film 5, and it can be used easily. Also, a cyclized rubber photoresist is made softer when it is sintered at a low temperature and it becomes harder when sintered at a high temperature, and in this case, desirable sintering temperature range is 100-300 deg.C. As a result, there is no possibility of characteristic deterioration of amorphous Si when an insulating material, which is a cyclized rubber photoresist in other words, is sintered and besides, a microscopic working can also be performed very easily on a microscopic material, thereby enabling to obtain an amorphous Si photosensor of excellent characteristics.
AbstractList PURPOSE:To enable to eliminate the possibility of deterioration in characteristics of amorphous Si by a method wherein a cyclized rubber photoresist material is utilized at a part of insulating material. CONSTITUTION:A Cr electrode 2 is formed on a glass substrate 1, a photodiode consisting of an amorphous Si layer 3 is provided thereon, and after an Al electrode 4 has been formed, a passivation is perfomred using a cyclized rubber photoresist film 5. Besides, a microscopic working can be freely performed on the film 5, and it can be used easily. Also, a cyclized rubber photoresist is made softer when it is sintered at a low temperature and it becomes harder when sintered at a high temperature, and in this case, desirable sintering temperature range is 100-300 deg.C. As a result, there is no possibility of characteristic deterioration of amorphous Si when an insulating material, which is a cyclized rubber photoresist in other words, is sintered and besides, a microscopic working can also be performed very easily on a microscopic material, thereby enabling to obtain an amorphous Si photosensor of excellent characteristics.
Author KANAI HIROMI
SAITOU SUSUMU
ORITSUKI RIYOUJI
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Snippet PURPOSE:To enable to eliminate the possibility of deterioration in characteristics of amorphous Si by a method wherein a cyclized rubber photoresist material...
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SubjectTerms BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
SEMICONDUCTOR DEVICES
Title AMORPHOUS SILICON PHOTOSENSOR
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