YIELD ELONGATION DETECTOR

• Main Author: MASUSE HIDEO
• Format: Patent
• Language: English
• Published: 18.10.1985
• Edition: 4
• Subjects: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASURING; PHYSICS; TESTING

PURPOSE:To detect the value of yield elongation of a test piece automatically, by differentiating the detected value of a load that is applied to the test piece at every sampling time, sequentially memorizing the result, and searching the final point of the yield elongation of the test piece in the reverse direction in time. CONSTITUTION:A load detector 1 and an elongation detector 2 of a test piece are connected to a memory device 3. A clock generator 4 is operated by a test starting command 5 and generates the clock at every sampling time of 50ms. In synchronization with the clock, the memory device 3 store the detected load value and detected elongation value. A differentiating device 6 differentiates the detected load value at every sampling time and stores the result in a memory device 7. After the clock generator 4 and the like are stopped by a test end command 8, an operating device 9 searches the final point C of the yield elongation of the test piece from a preset point G to a preset point E based on the load differentiated value in the memory device 7. Thus the yield elongation value of the test piece can be automatically detected.