TEST EQUIPMENT OF SOLID-STATE IMAGE PICKUP ELEMENT

PURPOSE:To attain accurate evaluation and analysis by extracting an image signal without spike voltage fluctuation in an MOS type color solid-state image pickup element test equipment so as to amplify the image signal only. CONSTITUTION:When a horizontal scanning line 10b is selected at times t1-t2...

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Bibliographic Details
Main Authors KURAMITSU YOUICHI, MAENO HIDESHI, OKADA KEISUKE
Format Patent
LanguageEnglish
Published 29.09.1984
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Summary:PURPOSE:To attain accurate evaluation and analysis by extracting an image signal without spike voltage fluctuation in an MOS type color solid-state image pickup element test equipment so as to amplify the image signal only. CONSTITUTION:When a horizontal scanning line 10b is selected at times t1-t2 by a horizontal scanning circuit 1, the spike voltage fluctuation 15 including the image signal 14 and the image signal of the spike voltage fluctuation 16 due to parasitic capcitance not including the image signal are outputted from image signal read lines 4 and 5 at the time t1. When signal of the fluctuation 15 is inputted to the non-inverting input terminal of a differential amplifier 19 and the signal of the fluctuation 16 is inputted to an inverting input terminal, the image signal without the spike voltage fluctuation is outputted from an output terminal 20. Thus, the test and evaluation are attained by amplifying this signal.
Bibliography:Application Number: JP19830048164