INSPECTING UNIT

PURPOSE:To determine the propriety of characteristics of a semiconductor for a very short time by allowing simultaneous measurement thereof. CONSTITUTION:For example, when performing a digital measurement, a control pulse is fed to lines l0 and l2 to determine the measuring timing, which enables a d...

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Bibliographic Details
Main Authors KIMURA KAZUHIKO, NAKAHARA KINICHI, OOYAMA YUUICHI, INOUE FUMIHITO
Format Patent
LanguageEnglish
Published 20.09.1983
Subjects
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Summary:PURPOSE:To determine the propriety of characteristics of a semiconductor for a very short time by allowing simultaneous measurement thereof. CONSTITUTION:For example, when performing a digital measurement, a control pulse is fed to lines l0 and l2 to determine the measuring timing, which enables a digital function inspection in the same operation as a DC parameter (characteristics of current and voltage) measurement is done. Various measurement can be done simultaneously for connection pins of an IC 21 to be measured for example, in such a manner that while current is measured for one pair of connection pins, outputs related to other amplifying section can be measured for another pair of connection pins. A memory circuit is arranged for sections corresponding to measuring items to eliminate the need for frequency feedback of information to an electronic computer.
Bibliography:Application Number: JP19820040792