INTEGRATED CIRCUIT WITH TEST CIRCUIT

• Main Author: FUNATSU SHIGEHIRO
• Format: Patent
• Language: English
• Published: 26.08.1983
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

PURPOSE:To manufacture the integrated circuit, which can simply investigate the cause of malfunction by providing a control means which drives the test circuit operating apart from a function circuit and transmits output signals to an output terminal. CONSTITUTION:A test circuit 141 for monitoring t...