INTEGRATED CIRCUIT WITH TEST CIRCUIT

• Main Author: FUNATSU SHIGEHIRO
• Format: Patent
• Language: English
• Published: 26.08.1983
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; SEMICONDUCTOR DEVICES

PURPOSE:To manufacture the integrated circuit, which can simply investigate the cause of malfunction by providing a control means which drives the test circuit operating apart from a function circuit and transmits output signals to an output terminal. CONSTITUTION:A test circuit 141 for monitoring the manufacturing process, a DC characteristics test circuit 142 and an AC characteristic test circuit 143 are each se up to the test circuit 140 separately. These each test circuit is driven by input signals supplied through input signal lines, and the results are given through output signal lines 141-1, 141-2, 141-p. Accordingly, when the function circuit 110 of the integrated circuit 101 is tested and the result is defective, whether malfunction as the test result of the function circuit 110 depends upon the malfunction of the manufacturing process or defective various characteristics, such as DC ones or AC ones or the like can simply be discriminated and classified by testing the test circuits 141, 142, 143 which can severally be driven apart from function circuits juxtaposed and set up to the function circuit 110.