APPROACH SENSOR FOR DISPLACEMENT DETECTION

PURPOSE:To obtain a voltage, proportional to a distance, at a wide range, by a method wherein a feedback amount to a resonance circuit is minutely controlled. CONSTITUTION:A means, which can minutely control a feedback amount to a resonance circuit, is provided. For example, one end of an LC oscilla...

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Bibliographic Details
Main Author ASADA TADAYOSHI
Format Patent
LanguageEnglish
Published 01.04.1982
Subjects
BASIC ELECTRONIC CIRCUITRY
DETECTING MASSES OR OBJECTS
ELECTRICITY
GEOPHYSICS
GRAVITATIONAL MEASUREMENTS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
PULSE TECHNIQUE
TESTING
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Summary:PURPOSE:To obtain a voltage, proportional to a distance, at a wide range, by a method wherein a feedback amount to a resonance circuit is minutely controlled. CONSTITUTION:A means, which can minutely control a feedback amount to a resonance circuit, is provided. For example, one end of an LC oscillating circuit 20 is connected to a base of a transistor 11, and the other end to an emitter via a variable resistance 5 to perform a positive feedback from a collector via a resistance 10. The output of the transistor 11 is inputted to another transistor 16 via a smoothing circuit 21. This causes changing of an inductance if an object to be detected approaches a detecting coil 1, and the change is produced into the damping of an oscillating output. The adjustment of the variable resistance 5 permits the rapid or the gradual stoppage of an oscillation to obtain a sensor having a high resolution.
Bibliography:Application Number: JP19800131369