MEASURING AND SORTING DEVICE FOR ELECTRIC CHARACTERISTICS OF SEMICONDUCTOR ELEMENT

• Main Author: KAWAGUCHI KATSUJI
• Format: Patent
• Language: English
• Published: 27.03.1982
• Subjects: BASIC ELECTRIC ELEMENTS; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR; ELECTRICITY; MEASURING; MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES; PHYSICS; SEMICONDUCTOR DEVICES; TESTING

PURPOSE:To enable to respond to the measurements of multiple functions and to increase the efficiency of the measurements in a device for measuring the electric characteristics of a semiconductor element having guide mechanism, feeding mechanism, measuring mechanism and sorting mechanism by providing a plurality of measuring mechanisms. CONSTITUTION:Two sets of measuring mechanisms B1, B2 are provided, engaging rods 15, 16 and a partition rod 17 are provided on an upper guide rail 4 corresponding to a measuring mechanism B2, and which has a contactor 19 having a contact piece 18 and an arm 20. When two sets of measuring mechanisms treat with measuring instrument having the same type electric characteristic measuring program, semiconductor elements are sequentially fed one by one by the engaging rod, and the partition rod moved upwardly and downwardly, and are measured by the measuring mechanisms. The measured elements are fed by a guide mechanism A, is then fed through a sorting mechanism C guided to the position corresponding to the measured result, and is then exhausted. In this manner, the measurement can be increased in the efficiency.