SEMICONDUCTOR DEVICE AND RESIN COMPOSITION FOR SEMICONDUCTOR SEALING

PROBLEM TO BE SOLVED: To provide a chip size semiconductor device of high reliability at a low cost, and resin composition for sealing semiconductor in which an excellent film can be formed on a wafer, warp of the wafer is small, and reliability is high, in a method manufacturing a semiconductor dev...

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Bibliographic Details
Main Authors KAWAHARA TOSHISANE, TAKIGAWA YUKIO, TSUTSUMI YASUAKI, TANAKA MASAYUKI
Format Patent
LanguageEnglish
Published 19.10.1999
Edition6
Subjects
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Summary:PROBLEM TO BE SOLVED: To provide a chip size semiconductor device of high reliability at a low cost, and resin composition for sealing semiconductor in which an excellent film can be formed on a wafer, warp of the wafer is small, and reliability is high, in a method manufacturing a semiconductor device by collectively sealing a semiconductor element in the state of a wafer. SOLUTION: In a semiconductor device in which a film of resin composition is formed on one surface of a semiconductor element, the coefficient of linear expansion of glass transition temperature or lower of the resin composition is 60×10<-6> /K or lower, and the coefficient of linear expansion of the glass transition temperature or higher is 140×10<-6> /K or lower. As to resin composition for sealing the semiconductor device, the coefficient of linear expansion of glass transition temperature or lower is 60×10<-6> /K or lower, and the coefficient of linear expansion of the glass transition temperature or higher is 140×10<-6> /K or lower.
Bibliography:Application Number: JP19990031468