SEMICONDUCTOR STORAGE DEVICE

PROBLEM TO BE SOLVED: To provide a semiconductor storage device which can monitor internal signals in the mold state. SOLUTION: A test signal generator circuit 40 generates test signals. In response to a test signal, a monitor circuit 20 realizes a condition in which a node N1 through which a sense...

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Bibliographic Details
Main Author ICHIGUCHI TETSUICHIRO
Format Patent
LanguageEnglish
Published 29.01.1999
Edition6
Subjects
INFORMATION STORAGE
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
STATIC STORES
TESTING
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Summary:PROBLEM TO BE SOLVED: To provide a semiconductor storage device which can monitor internal signals in the mold state. SOLUTION: A test signal generator circuit 40 generates test signals. In response to a test signal, a monitor circuit 20 realizes a condition in which a node N1 through which a sense amplifier activating signal So passes, a node N2 through which a column decoder activating signal CDE passes, or a node N3 through which the output control signal OEM passes is connected with the /WE pin. On the other hand, an output control circuit 55 receives the write enable signal /WE at the H level from a control circuit 30 at the time of the test mode of an internal signal monitor. By this, it is possible to monitor internal signals about the access path from the /WE pin.
Bibliography:Application Number: JP19970176969