CONCENTRICITY MEASURING DEVICE

• Main Authors: KATAGIRI KENICHI, SONE SEIICHIRO
• Format: Patent
• Language: English
• Published: 30.07.1999
• Edition: 6
• Subjects: MEASURING; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS; PHYSICS; TESTING

PROBLEM TO BE SOLVED: To provide a concentricity measuring device capable of simply and accurately measuring the concentricity of a stepped hole at a site. SOLUTION: A stepped hole 2 has a reference hole 3 and a measurement hole 4. Guide rollers 8, 9, 10 are located at uniform intervals on the circumference 7 of the bottom face of the substrate 5 of this device 1, and they are kept in contact with the inner periphery of the reference hole 3. The rollers 8, 9 are of a fixed type, and the roller 10 is of a rocking type. If the diameter size of the reference hole 3 differs within a tolerance range, the guide rollers 8, 9, 10 can be inserted into the reference hole 3. The substrate 5 has a probe 12. The rocking motion of the probe 12 inserted into a through hole 14 formed on the substrate 5 is interlocked with the motion of the pointer of an indicator 19. The tip section of the probe 12 is biased into contact with the inner periphery 4a of the measurement hole 4. The substrate 5 is installed on the end face of an object component to be measured, and the guide rollers 8, 9, 10 are inserted into the reference hole 3. The tip section of the probe 12 is kept in contact with the inner periphery 4a of the measurement hole 4, and the substrate 5 is rotated on the end face. The probe 12 is moved along the inner periphery 4a. The deflection quantity of the pointer of the indicator 19 is read while the substrate 5 is rotated once along the reference hole 3, and the concentricity of both holes 3, 4 is confirmed.