SCANNING NEAR-FIELD MICROSCOPE UTILIZING POLARIZATION
PROBLEM TO BE SOLVED: To enable high-sensitivity, high-resolution, quantitative observation and measurement of the circular dichroism and the optical rotating power of a sample by using a scanning type near-field microscope which utilizes polarization. SOLUTION: An optical fiber probe 1 having a min...
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Main Authors | , , |
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Format | Patent |
Language | English |
Published |
08.12.1998
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Edition | 6 |
Subjects | |
Online Access | Get full text |
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Summary: | PROBLEM TO BE SOLVED: To enable high-sensitivity, high-resolution, quantitative observation and measurement of the circular dichroism and the optical rotating power of a sample by using a scanning type near-field microscope which utilizes polarization. SOLUTION: An optical fiber probe 1 having a minute opening at the sharpened tip is brought close to a sample 2, and scanning in the x and y directions is performed by a piezo-actuator 15 lighting the sample 2 with near- field light from the minute opening. To combine with circularly polarized light modulation, an optical delay of a frequency p (Hz) is given to light incident on the optical fiber probe 1 by using an optical piezo-modulator 10. After penetrating a sample 2, a near-field light emitted from the minute opening passes an analyzer 5, and is received by a photodetector 7. The output of the photodetector 7 is inputted to a lock-in amplifier 8, and its p and 2p components are lock-in-detected, and changed into picture images by a controller 16. |
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Bibliography: | Application Number: JP19970134178 |