THIN-FILM CAPACITOR MADE OF TANTALUM OXIDE
PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin-film capacitor made of tantalum oxide. SOLUTION: A thin-film capacitor 20 has a lower electrode 23 that is made of TaNx a dielectric layer 26 that is made of tantalum oxide where nitrogen or silicon is doped (TaNx O5 or Ta2 SiO being...
Saved in:
Main Authors | , |
---|---|
Format | Patent |
Language | English |
Published |
25.09.1998
|
Edition | 6 |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | PROBLEM TO BE SOLVED: To provide a method for manufacturing a thin-film capacitor made of tantalum oxide. SOLUTION: A thin-film capacitor 20 has a lower electrode 23 that is made of TaNx a dielectric layer 26 that is made of tantalum oxide where nitrogen or silicon is doped (TaNx O5 or Ta2 SiO being subjected to anode oxidation), and an upper electrode 27 containing chromium. As a result, the leakage current of the capacitor 20 is equal to or less than 1nA/cm or less, a breakdown electric field is 4MV/cm or larger, and a capacitance density is 70nF/cm . Also, the capacitor 20 shows a stable performance even at 350 deg.C and the area can be set to a width of 1mm or more. |
---|---|
Bibliography: | Application Number: JP19980043609 |