MICROPROCESSOR

PROBLEM TO BE SOLVED: To provide a microprocessor equiped with built-in type fault diagnosis devices free from various restrictions. SOLUTION: The microprocessor 10 acts in response to a clock signal CLK with clock cycle. The microprocessor 10 is provided with a readable memory 16, with stores a cod...

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Bibliographic Details
Main Authors DONALD E STITH, JAMES O BONDY, JOEL J GLOVER
Format Patent
LanguageEnglish
Published 29.05.1998
Edition6
Subjects
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Summary:PROBLEM TO BE SOLVED: To provide a microprocessor equiped with built-in type fault diagnosis devices free from various restrictions. SOLUTION: The microprocessor 10 acts in response to a clock signal CLK with clock cycle. The microprocessor 10 is provided with a readable memory 16, with stores a code BIST to diagnose and evaluate the microprocessor 10. The first evaluation generated under operation without fault in the first clock cycle and the last evaluation generated under operation without fault in the last clock cycle are included in diagnosis and evaluation. Furthermore, a circuit 14 to generate a series of address to the readable memory to address the code to diagnose and evaluate the microprocessor 10 is included in the microprocessor. A fault of diagnosis and evaluation before the last clock cycle is indicated by difference from a scheduled pattern of a diagnostic signal before the last clock cycle.
Bibliography:Application Number: JP19970301184