METHOD AND APPARATUS FOR ANALYZING SPECTRAL DATA AND STORAGE MEDIUM READABLE BY COMPUTER UTILIZED FOR ANALYSIS OF SPECTRAL DATA

• Main Authors: GANZ ALAN M, TRACY DAVID H, WANG YONGDONG, HUPPLER DAVID A, CHRISTOPHER B HANNA, IVALDI JUAN C
• Format: Patent
• Language: English
• Published: 29.05.1998
• Edition: 6
• Subjects: COLORIMETRY; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT; MEASURING; PHYSICS; RADIATION PYROMETRY; TESTING

PROBLEM TO BE SOLVED: To correctly measure a spectrum by obtaining a spectral shift to an optionally selected sub array position from a difference of offset functions calculated from two offset data of different times. SOLUTION: A first spectral data 40 is collected 42 to a first time 43 of a drift standard. Peak points are compared 46 at a zero position, thereby obtaining a first offset data 50. A first offset function 52 as an xy coordinate function of a sub array is obtained from the data 50 by a computer 54. Thereafter, a second spectral data 56 is collected 42 to a second time 60, and a second offset function 64 is calculated. A difference function 68 of an xy positions in the interval is obtained from a difference 66 of the offset functions 52 and 64, which is interpolated at 70, whereby a spectral shift 72 is obtained. The spectral shift 72 is applied to an optional sample data 76 collected to an optional time 80, and standardized to an optional base time, e.g. the first time 43.