SPUTTERING TARGET

PROBLEM TO BE SOLVED: To easily uniformize the erosion quantity of plural target materials having mutually different sputtering rates without causing the change in the shape of a cathode, the intrusion of impurity materials and the generation of dust regardless of DC sputtering and RF sputtering. SO...

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Bibliographic Details
Main Authors ISHIGAMI TAKASHI, SAKAI AKIRA, HIRAYAMA HIDEO, TAKADO TEIJI, HIDAKA KOJI
Format Patent
LanguageEnglish
Published 11.03.1997
Edition6
Subjects
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Summary:PROBLEM TO BE SOLVED: To easily uniformize the erosion quantity of plural target materials having mutually different sputtering rates without causing the change in the shape of a cathode, the intrusion of impurity materials and the generation of dust regardless of DC sputtering and RF sputtering. SOLUTION: This sputtering target 4 has mosaically arranged plural target materials 1 and 2 and a backing plate 3 supporting these plural target materials 1 and 2. In the plural target materials 1 and 2, in the lower direction of the target material 1 high in the sputtering rate, a ferromagnetic material sheet 5 is arranged, by which the magnetic field intensity in the upper direction of the target material 1 high in the sputtering rate is reduced.
Bibliography:Application Number: JP19950218583